REGE, S.; DAVIES, R.M.; GRIFFIN, W.L.; JACKSON, S.; O'REILLY, S.Y. Trace element analysis of diamond by LAM ICPMS: preliminary results. International Kimberlite Conference: Extended Abstracts, [S. l.], v. 8, 2003. DOI: 10.29173/ikc3041. Disponível em: https://ikcabstracts.com/index.php/ikc/article/view/3041. Acesso em: 28 apr. 2024.